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DFT
2003
IEEE
14 years 29 days ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
ASPDAC
1995
ACM
13 years 11 months ago
1995
ACM
- In this paper, we present a new scheduling algorithms that generates area-efficient register transfer level datapaths with multiport memories. The proposed scheduling algorithm a...
ISSTA
2006
ACM
14 years 1 months ago
2006
ACM
There are several problem areas that must be addressed when applying randomization to unit testing. As yet no general, fully automated solution that works for all units has been p...
DATE
2003
IEEE
14 years 29 days ago
2003
IEEE
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...