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VTS
1996
IEEE
75views Hardware» more  VTS 1996»
13 years 12 months ago
A new test pattern generation method for delay fault testing
S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
STVR
2008
53views more  STVR 2008»
13 years 7 months ago
IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing
Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun,...
JISE
2000
71views more  JISE 2000»
13 years 7 months ago
Compact Test Generation Using a Frozen Clock Testing Strategy
Elizabeth M. Rudnick, Miron Abramovici