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search results - page 25 / 1171
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Test generation and minimization with
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HASE
1998
IEEE
128
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Control Systems
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HASE 1998
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In-Parameter-Order: A Test Generation Strategy for Pairwise Testing
13 years 12 months ago
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www-cse.uta.edu
Yu Lei, Kuo-Chung Tai
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29
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VTS
1996
IEEE
75
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Hardware
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VTS 1996
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A new test pattern generation method for delay fault testing
13 years 12 months ago
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www.lirmm.fr
S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
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21
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DAC
1992
ACM
93
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Computer Architecture
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DAC 1992
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SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
13 years 11 months ago
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poisson.usc.edu
Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
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8
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STVR
2008
53
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STVR 2008
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IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing
13 years 7 months ago
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csrc.nist.gov
Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun,...
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19
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JISE
2000
71
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JISE 2000
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Compact Test Generation Using a Frozen Clock Testing Strategy
13 years 7 months ago
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www.iis.sinica.edu.tw
Elizabeth M. Rudnick, Miron Abramovici
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