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DATE
2000
IEEE
14 years 2 days ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
CONCUR
2006
Springer
13 years 11 months ago
2006
Springer
Boolean programs with recursion are convenient abstractions of sequential imperative programs, and can be represented as recursive state machines (RSMs) or pushdown automata. Motiv...
DFT
2003
IEEE
14 years 29 days ago
2003
IEEE
1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...