143 search results - page 15 / 29 » Test generation for designs with multiple clocks |
TVLSI
2008
13 years 7 months ago
2008
Recently, it has become possible to implement floating-point cores on field-programmable gate arrays (FPGAs) to provide acceleration for the myriad applications that require high-p...
GLVLSI
2009
IEEE
13 years 11 months ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...
SIGCSE
2008
ACM
13 years 6 months ago
2008
ACM
We present the design and development of a Visual Learning Engine, a tool that can form the basis for interactive development of visually rich teaching and learning modules across...
ACMSE
2004
ACM
14 years 1 months ago
2004
ACM
This paper presents a specification-driven approach to test automation for GUI-based JAVA programs as an alternative to the use of capture/replay. The NetBeans Jemmy library provi...
ITC
2003
IEEE
14 years 27 days ago
2003
IEEE
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...