112 search results - page 6 / 23 » Test generation in VLSI circuits for crosstalk noise |
ATS
2003
IEEE
14 years 28 days ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
DFT
2004
IEEE
13 years 11 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...
TCAD
2010
13 years 2 months ago
2010
Crosstalk faults have emerged as a significant mechanism for circuit failure. Long signal nets are of particular concern because they tend to have a higher coupling capacitance to...
EURODAC
1995
IEEE
13 years 11 months ago
1995
IEEE
We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signi cantly a ect the actual...