112 search results - page 9 / 23 » Test generation in VLSI circuits for crosstalk noise |
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
EH
2000
IEEE
14 years 1 days ago
2000
IEEE
How do we know the correctness of an evolved circuit? While Evolutionary Hardware is exhibiting its effectiveness, we argue that it is very difficult to design a large-scale digit...
GLVLSI
2005
IEEE
14 years 1 months ago
2005
IEEE
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Multi-channel waveform monitoring technique enhances built-in test and diagnostic capability of mixed-signal VLSI circuits. An 8-channel prototype system incorporates adaptive sam...
DATE
1999
IEEE
13 years 12 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...