502 search results - page 4 / 101 » Test pattern generation based on arithmetic operations |
ITC
1994
IEEE
14 years 1 days ago
1994
IEEE
ICCAD
2000
IEEE
14 years 28 days ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
TCAD
2008
13 years 8 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
IOLTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
KBSE
2003
IEEE
14 years 1 months ago
2003
IEEE
Unit testing, a common step in software development, presents a challenge. When produced manually, unit test suites are often insufficient to identify defects. The main alternativ...