502 search results - page 6 / 101 » Test pattern generation based on arithmetic operations |
SAS
2007
Springer
14 years 2 months ago
2007
Springer
Abstract. Shape analyses are often imprecise in their numerical reasoning, whereas numerical static analyses are often largely unaware of the shape of a program’s heap. In this p...
IWANN
1995
Springer
14 years 2 days ago
1995
Springer
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
VLSID
2009
IEEE
14 years 9 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
ICCD
2002
IEEE
14 years 5 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
ISCAS
1999
IEEE
14 years 25 days ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...