Abstract. Shape analyses are often imprecise in their numerical reasoning, whereas numerical static analyses are often largely unaware of the shape of a program’s heap. In this p...
Stephen Magill, Josh Berdine, Edmund M. Clarke, By...
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...