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96
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ASYNC
2007
IEEE
107views Hardware» more  ASYNC 2007»
15 years 8 months ago
On-chip samplers for test and debug of asynchronous circuits
On-chip high-bandwidth sampling circuits supplement traditional test and debug techniques by non-invasively probing analog voltages for off-chip measurement. Existing circuits rel...
Frankie Liu, Ron Ho, Robert J. Drost, Scott Fairba...
ICRA
2006
IEEE
81views Robotics» more  ICRA 2006»
15 years 8 months ago
Hardware-in-the-loop Test Rig for Designing Near-earth Aerial Robotics
Today’s aerial robots are being tasked to fly in nearEarth environments such as caves, forests and buildings. The lack of flight data and performance metrics poses a gap that ...
Vefa Narli, Paul Y. Oh
107
Voted
MTDT
2002
IEEE
108views Hardware» more  MTDT 2002»
15 years 7 months ago
A Fault Modeling Technique to Test Memory BIST Algorithms
The amount of memory being embedded on chip is growing rapidly. This strongly implies that memory Built-in-self-test (BIST) logic assumes utmost importance amongst all on chip sel...
Raja Venkatesh, Sailesh Kumar, Joji Philip, Sunil ...
110
Voted
WSC
2007
15 years 4 months ago
Enabling industrial scale simulation/emulation models
OLE Process Control (OPC) is an industry standard that facilitates the communication between PCs and Programmable Logic Controllers (PLC). This communication allows for the testin...
Michael Johnstone, Douglas C. Creighton, Saeid Nah...
VTS
2006
IEEE
102views Hardware» more  VTS 2006»
15 years 8 months ago
Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes
We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual co...
Rong Zhang, Zeljko Zilic, Katarzyna Radecka