244 search results - page 44 / 49 » Testing Digital Circuits with Constraints |
ASPDAC
2010
ACM
13 years 6 months ago
2010
ACM
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...
ISPD
2009
ACM
14 years 3 months ago
2009
ACM
As VLSI technology moves to the 65nm node and beyond, interconnect delay greatly limits the circuit performance. As a critical component in interconnect synthesis, layer assignmen...
MM
2009
ACM
2009
ACM
Distance metric learning from uncertain side information with application to automated photo tagging
14 years 1 months ago
Automated photo tagging is essential to make massive unlabeled photos searchable by text search engines. Conventional image annotation approaches, though working reasonably well o...
IPSN
2010
Springer
13 years 10 months ago
2010
Springer
In-network processing is recommended for many sensor network applications to reduce communication and improve energy efficiency. However, constraints on memory, speed, and energy ...
ISCA
2009
IEEE
14 years 3 months ago
2009
IEEE
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...