1610 search results - page 20 / 322 » Testing Patterns |
ICCAD
2001
IEEE
14 years 6 months ago
2001
IEEE
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
ITC
1991
IEEE
14 years 1 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
PAMI
2008
13 years 10 months ago
2008
This paper describes a method for robust real time pattern matching. We first introduce a family of image distance measures, the "Image Hamming Distance Family". Members ...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
AMAI
2002
Springer
13 years 9 months ago
2002
Springer
: It is claimed that human inferential apparatus offers interesting ground in order to consider the intuitions of artificial intelligence researchers about the inference patterns a...