1610 search results - page 3 / 322 » Testing Patterns |
DELTA
2008
IEEE
14 years 2 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
ETS
2009
IEEE
13 years 5 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
ITC
1996
IEEE
13 years 11 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...