1610 search results - page 46 / 322 » Testing Patterns |
ICCAD
1994
IEEE
14 years 2 months ago
1994
IEEE
This paper presents a new method of selecting scan
ipops (FFs) in partial scan designs of sequential circuits. Scan FFs are chosen so that the whole circuit can be partitioned in...
PAMI
2008
13 years 10 months ago
2008
We propose a new two-stage framework for joint analysis of head gesture and speech prosody patterns of a speaker toward automatic realistic synthesis of head gestures from speech p...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
ACMSE
2010
ACM
13 years 8 months ago
2010
ACM
In this paper, we describe an ontology-driven pattern disambiguation process for Rote Extractors. Our approach can generate lexical patterns for a particular relation from unrestr...
EVOW
2001
Springer
14 years 2 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...