1610 search results - page 50 / 322 » Testing Patterns |
PVLDB
2010
13 years 8 months ago
2010
We present Data Auditor, a tool for exploring data quality and data semantics. Given a rule or an integrity constraint and a target relation, Data Auditor computes pattern tableau...
TVLSI
2010
13 years 4 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
ICRA
2010
IEEE
13 years 8 months ago
2010
IEEE
— We present here an original approach to test the feasibility of footsteps for a given walking pattern generator. It is based on a new approximation algorithm intended to cope w...
GCB
2009
Springer
14 years 4 months ago
2009
Springer
: A wealth of time series of microarray measurements have become available over recent years. Several two-sample tests for detecting differential gene expression in these time seri...
DATE
2004
IEEE
14 years 1 months ago
2004
IEEE
This paper presents 3LSSD, a novel, easilyautomatable approach for scan insertion and ATPG of asynchronous circuits. 3LSSD inserts scan latches only into global circuit feedback p...