1610 search results - page 9 / 322 » Testing Patterns |
ATS
2009
IEEE
14 years 4 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
ICCAD
1998
IEEE
14 years 2 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
ISQED
2002
IEEE
14 years 2 months ago
2002
IEEE
This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...