1554 search results - page 152 / 311 » Testing Polymorphic Behavior |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy, or more generally, a suboptimality in the synthe...
DDECS
2007
IEEE
14 years 2 months ago
2007
IEEE
Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
MEMOCODE
2007
IEEE
14 years 2 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
ICCS
2007
Springer
14 years 2 months ago
2007
Springer
New architectures for Brain-Machine Interface communication and control use mixture models for expanding rehabilitation capabilities of disabled patients. Here we present and test ...
VTS
2005
IEEE
14 years 1 months ago
2005
IEEE
The power supply transient signal (IDDT) method that we propose for defect detection analyze regional signal variations introduced by defects at a set of power supply pads on the ...