30 search results - page 1 / 6 » Testing Static and Dynamic Faults in Random Access Memories |
VTS
2002
IEEE
14 years 3 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
MTDT
2002
IEEE
14 years 3 months ago
2002
IEEE
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
ATS
2009
IEEE
14 years 5 months ago
2009
IEEE
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...
ETS
2007
IEEE
14 years 5 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...