6941 search results - page 112 / 1389 » Testing as a Certification Approach |
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
DATE
2002
IEEE
14 years 24 days ago
2002
IEEE
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
ET
2000
13 years 7 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
APSEC
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract--Real-time embedded systems (RTESs) are becoming increasingly ubiquitous, controlling a wide variety of popular and safety-critical devices. Effective testing techniques c...