6941 search results - page 146 / 1389 » Testing as a Certification Approach |
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
ATS
2003
IEEE
14 years 1 months ago
2003
IEEE
1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is equivalent to independent job scheduling on identical machines and we make use of an exi...
DFT
2002
IEEE
14 years 27 days ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
DATE
2010
IEEE
14 years 8 days ago
2010
IEEE
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
COMPSAC
2007
IEEE
13 years 12 months ago
2007
IEEE
Mesh simplification is a mainstream technique to render graphics responsively in modern graphical software. However, the graphical nature of the output poses a test oracle problem...