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ATS
1996
IEEE
93views Hardware» more  ATS 1996»
14 years 8 days ago
Testable Design and Testing of MCMs Based on Multifrequency Scan
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
Wang-Dauh Tseng, Kuochen Wang
GI
2007
Springer
13 years 12 months ago
Creating Test-Cases Incrementally with Model-Checkers
: Test-case generation with model-checkers is a promising field of research in software testing. Model-checker based approaches offer many advantages: They are fully automated, the...
Gordon Fraser, Franz Wotawa
WSC
2007
13 years 10 months ago
Distributed simulation for interoperability testing along the supply chain
The need for interoperability of information systems among supply chain partners has been recognized. A number of standards have been or are being developed to ensure interoperabi...
Sanjay Jain, Frank Riddick, Andreas Craens, Deogra...
COLT
2008
Springer
13 years 10 months ago
Learning Acyclic Probabilistic Circuits Using Test Paths
We define a model of learning probabilistic acyclic circuits using value injection queries, in which an arbitrary subset of wires is set to fixed values, and the value on the sing...
Dana Angluin, James Aspnes, Jiang Chen, David Eise...
CSREAESA
2008
13 years 9 months ago
BIST-BASED Group Testing for Diagnosis of Embedded FPGA Cores
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara