In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
: Test-case generation with model-checkers is a promising field of research in software testing. Model-checker based approaches offer many advantages: They are fully automated, the...
The need for interoperability of information systems among supply chain partners has been recognized. A number of standards have been or are being developed to ensure interoperabi...
Sanjay Jain, Frank Riddick, Andreas Craens, Deogra...
We define a model of learning probabilistic acyclic circuits using value injection queries, in which an arbitrary subset of wires is set to fixed values, and the value on the sing...
Dana Angluin, James Aspnes, Jiang Chen, David Eise...
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
Alireza Sarvi, Carthik A. Sharma, Ronald F. DeMara