6941 search results - page 53 / 1389 » Testing as a Certification Approach |
SNPD
2004
13 years 9 months ago
2004
The problem of testing programs without test oracles is well known. A commonly used approach is to use special values in testing but this is often insufficient to ensure program c...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
DSD
2005
IEEE
14 years 1 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
ITC
2002
IEEE
14 years 18 days ago
2002
IEEE
ct Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that...
DELTA
2008
IEEE
14 years 2 months ago
2008
IEEE
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...