6941 search results - page 55 / 1389 » Testing as a Certification Approach |
ISSTA
2009
ACM
14 years 2 months ago
2009
ACM
Metamorphic testing has been shown to be a simple yet effective technique in addressing the quality assurance of applications that do not have test oracles, i.e., for which it is ...
KDD
2000
ACM
13 years 11 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
VTS
2003
IEEE
14 years 28 days ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
ATS
2004
IEEE
13 years 11 months ago
2004
IEEE
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...