11718 search results - page 26 / 2344 » Testing database applications |
ITC
1998
IEEE
14 years 1 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
CORR
2010
Springer
13 years 9 months ago
2010
Springer
Identification of defective members of large populations has been widely studied in the statistics community under the name of group testing. It involves grouping subsets of items...
DAGSTUHL
2006
13 years 10 months ago
2006
We show that Kolmogorov complexity and such its estimators as universal codes (or data compression methods) can be applied for hypothesis testing in a framework of classical mathe...
WWW
2009
ACM
14 years 9 months ago
2009
ACM
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...