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ATS
2003
IEEE
106views Hardware» more  ATS 2003»
14 years 22 days ago
Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders
Luigi Dilillo, Patrick Girard, Serge Pravossoudovi...
IROS
2006
IEEE
140views Robotics» more  IROS 2006»
14 years 1 months ago
Developing a non-intrusive biometric environment
— The development of large scale biometric systems requires experiments to be performed on large amounts of data. Existing capture systems are designed for fixed experiments and...
Lee Middleton, David K. Wagg, Alex I. Bazin, John ...
GLOBECOM
2010
IEEE
13 years 5 months ago
An Exit-Chart Aided Design Procedure for Near-Capacity N-Component Parallel Concatenated Codes
1 Shannon's channel capacity specifies the upper bound on the amount of bits per channel use. In this paper, we explicitly demonstrate that twin-component turbo codes suffer f...
Hong Chen, Robert G. Maunder, Lajos Hanzo
ITC
2003
IEEE
123views Hardware» more  ITC 2003»
14 years 22 days ago
Hysteresis of Intrinsic IDDQ Currents
: Empirical analyses of the IDDQ signatures of 0.18 µm devices indicate that IDDQ currents exhibit hysteresis. A newly proposed test method, SPIRIT (Single Pattern Iteration IDDQ ...
Yukio Okuda, Nobuyuki Furukawa