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» Testing in the Component Age
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115
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DATE
2005
IEEE
224views Hardware» more  DATE 2005»
15 years 9 months ago
Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL
This paper describes two research projects that develop new low-cost techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals. Each project uses commercially ...
David C. Keezer, C. Gray, A. M. Majid, N. Taher
112
Voted
ICASSP
2008
IEEE
15 years 10 months ago
Deploying GOOG-411: Early lessons in data, measurement, and testing
We describe our early experience building and optimizing GOOG-411, a fully automated, voice-enabled, business finder. We show how taking an iterative approach to system developme...
Michiel Bacchiani, Françoise Beaufays, Joha...
103
Voted
IROS
2007
IEEE
122views Robotics» more  IROS 2007»
15 years 10 months ago
Design and experimental evaluation of rotor speed regulators for model helicopters in a test bench
— This work is focused on the design of a rotor speed regulator for small-scale helicopters. A nominal model identification for the main rotor is performed using a hybrid proced...
Alexandre Simões Martins, Antônio Pad...
116
Voted
INEX
2004
Springer
15 years 9 months ago
Reliability Tests for the XCG and inex-2002 Metrics
In this paper we compare the effectiveness scores and system rankings obtained with the inex-2002 metric, the official measure of INEX 2004, and the XCG metrics proposed in [4] an...
Gabriella Kazai, Mounia Lalmas, Arjen P. de Vries
117
Voted
ICCD
2002
IEEE
122views Hardware» more  ICCD 2002»
15 years 8 months ago
Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
Sule Ozev, Alex Orailoglu