We discuss the problem of concurrent error detection (CED) with bounded latency in finite state machines (FSMs). The objective of this approach is to reduce the overhead of CED, a...
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
Abstract—The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, ev...
The problem of extracting a minimal number of data points from a large dataset, in order to generate a support vector machine (SVM) classifier, is formulated as a concave minimiza...
A semi-visual framework for the speci cation of syntax and semantics of imperative programming languages, called Montages, was proposed in an earlier work by the authors. The prima...
Matthias Anlauff, Philipp W. Kutter, Alfonso Piera...