1618 search results - page 41 / 324 » Testing random number generators |
EMSOFT
2008
Springer
13 years 11 months ago
2008
Springer
The Simulink/Stateflow (SL/SF) environment from Mathworks is becoming the de facto standard in industry for model based development of embedded control systems. Many commercial to...
VLSID
2006
IEEE
14 years 3 months ago
2006
IEEE
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
IEEEPACT
1997
IEEE
14 years 2 months ago
1997
IEEE
† In this paper, we propose a parallel randomized algorithm, called Parallel Fast Assignment using Search Technique (PFAST), for scheduling parallel programs represented by direc...
DFT
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...