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FATES
2003
Springer
14 years 29 days ago
Mutually Enhancing Test Generation and Specification Inference
Generating effective tests and inferring likely program specifications are both difficult and costly problems. We propose an approach in which we can mutually enhance the tests and...
Tao Xie, David Notkin
STTT
2008
117views more  STTT 2008»
13 years 7 months ago
An approach to quality engineering of TTCN-3 test specifications
Abstract Experience with the development and maintenance of large test suites specified using the Testing and Test Control Notation (TTCN-3) has shown that it is difficult to const...
Helmut Neukirchen, Benjamin Zeiss, Jens Grabowski
MBEES
2008
13 years 9 months ago
Composition of Model-based Test Coverage Criteria
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
Mario Friske, Bernd-Holger Schlingloff, Stephan We...
ITC
1998
IEEE
95views Hardware» more  ITC 1998»
14 years 10 hour ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
DATE
2006
IEEE
78views Hardware» more  DATE 2006»
14 years 1 months ago
Functional constraints vs. test compression in scan-based delay testing
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
Ilia Polian, Hideo Fujiwara