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DAC
1999
ACM
14 years 5 days ago
Test Generation for Gigahertz Processors Using an Automatic Functional Constraint Extractor
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
Raghuram S. Tupuri, Arun Krishnamachary, Jacob A. ...
ISQED
2003
IEEE
147views Hardware» more  ISQED 2003»
14 years 1 months ago
On Structural vs. Functional Testing for Delay Faults
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li...
ITC
1997
IEEE
92views Hardware» more  ITC 1997»
14 years 2 days ago
A Novel Functional Test Generation Method for Processors Using Commercial ATPG
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
Raghuram S. Tupuri, Jacob A. Abraham
DAC
2008
ACM
14 years 8 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
DATE
2006
IEEE
111views Hardware» more  DATE 2006»
14 years 1 months ago
Functional test generation using property decompositions for validation of pipelined processors
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...
Heon-Mo Koo, Prabhat Mishra