2006 search results - page 113 / 402 » Testing with Respect to Concerns |
ACL
2007
13 years 11 months ago
2007
While the average performance of statistical parsers gradually improves, they still attach to many sentences annotations of rather low quality. The number of such sentences grows ...
DAC
2006
ACM
14 years 11 hour ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
—Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern...
ASPDAC
2007
ACM
14 years 2 months ago
2007
ACM
- The power dissipation (PT) and delay time (tdT) of a CMOS clock driver were minimized. Eight test circuits, each of which has 2 two-stage clock drivers, and a register array were...
DLS
2007
13 years 12 months ago
2007
This paper presents a package management system for the Scheme programming language. It is inspired by the Comprehensive Perl Archive Network (CPAN) and various GNU/Linux distribu...