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» Testing with Respect to Concerns
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VTS
2008
IEEE
136views Hardware» more  VTS 2008»
14 years 1 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
ISSAC
2001
Springer
123views Mathematics» more  ISSAC 2001»
14 years 1 days ago
A probabilistic algorithm to test local algebraic observability in polynomial time
The following questions are often encountered in system and control theory. Given an algebraic model of a physical process, which variables can be, in theory, deduced from the inp...
Alexandre Sedoglavic
EON
2008
13 years 9 months ago
Semantic Web Service Discovery and Selection: a Test Bed Scenario
Abstract. The Semantic Web Service Challenge is one of the major initiative dedicated to work on Semantic Web Service (SWS) discovery and selection. It represents an effective mann...
Alessio Carenini, Dario Cerizza, Marco Comerio, Em...
XPU
2010
Springer
13 years 6 months ago
Put It to the Test: Using Lightweight Experiments to Improve Team Processes
Experimentation is one way to gain insight into how processes perform for a team, but industry teams rarely do experiments, fearing that such educational excursions will incur extr...
Michael Keeling
ICCD
2003
IEEE
109views Hardware» more  ICCD 2003»
14 years 4 months ago
Independent Test Sequence Compaction through Integer Programming
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
Petros Drineas, Yiorgos Makris