As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate threedimensional interconnect models. In this paper, we describe...
Nuno Alexandre Marques, Mattan Kamon, Jacob White,...
We describe a new extraction tool, EMX (Electro-Magnetic eXtractor), for the analysis of RF, analog and high-speed digital circuits. EMX is a fast full-wave field solver. It incor...
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
Bart Vermeulen, Mohammad Zalfany Urfianto, Sandeep...
Directed test program-based verification or formal verification methods are usually quite ineffective on large cachecoherent, non-uniform memory access (CC-NUMA) multiprocessors b...
In this paper we provide a general method to derive productform solutions for stochastic models. We take inspiration from the Reversed Compound Agent Theorem [14] and we provide a...