193 search results - page 26 / 39 » The Capacitated m-Ring-Star Problem |
DFT
2003
IEEE
14 years 1 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
DATE
2002
IEEE
14 years 1 months ago
2002
IEEE
Accurate gate-level static timing analysis in the presence of RC loads has become an important problem for modern deep-submicron designs. Non-capacitive loads are usually analyzed...
DATE
2000
IEEE
14 years 26 days ago
2000
IEEE
As the CMOS technology scaled down, the horizontal coupling capacitance between adjacent wires plays dominant part in wire load, crosstalk interference becomes a serious problem f...
DAC
2000
ACM
14 years 24 days ago
2000
ACM
This paper develops the noise-counterparts to familiar delay formulas like Elmore or PRIMO. By matching the first few moments of the network’s transfer impedance, we obtain effi...
DAC
1999
ACM
14 years 23 days ago
1999
ACM
As the family of Alpha microprocessors continues to scale into more advanced technologies with very high frequency edge rates and multiple layers of interconnect, the issue of cha...