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TOG
2012
258views Communications» more  TOG 2012»
11 years 10 months ago
Stitch meshes for modeling knitted clothing with yarn-level detail
ike abstraction of the yarn model; (c) then, we specify the desired knitting pattern over the stitch mesh’s surface. (d) Following the interactive modeling process, the model goe...
Cem Yuksel, Jonathan M. Kaldor, Doug L. James, Ste...
JSA
2008
108views more  JSA 2008»
13 years 7 months ago
A methodology to design arbitrary failure detectors for distributed protocols
Nowadays, there are many protocols able to cope with process crashes, but, unfortunately, a process crash represents only a particular faulty behavior. Handling tougher failures (...
Roberto Baldoni, Jean-Michel Hélary, Sara T...
HIPEAC
2007
Springer
14 years 1 months ago
Fetch Gating Control Through Speculative Instruction Window Weighting
In a dynamic reordering superscalar processor, the front-end fetches instructions and places them in the issue queue. Instructions are then issued by the back-end execution core. T...
Hans Vandierendonck, André Seznec
AIML
2008
13 years 9 months ago
Valentini's cut-elimination for provability logic resolved
In 1983, Valentini presented a syntactic proof of cut-elimination for a sequent calculus GLSV for the provability logic GL where we have added the subscript V for "Valentini&q...
Rajeev Goré, Revantha Ramanayake
DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu