59 search results - page 5 / 12 » The Impact of Technology Scaling on Lifetime Reliability |
CODES
2010
IEEE
13 years 7 months ago
2010
IEEE
With the continuous scaling of semiconductor technology, the life-time of circuit is decreasing so that processor failure becomes an important issue in MPSoC design. A software so...
ISCA
2010
IEEE
14 years 1 months ago
2010
IEEE
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
SC
2009
ACM
14 years 4 months ago
2009
ACM
Continuous evolution in process technology brings energyefficiency and reliability challenges, which are harder for memory system designs since chip multiprocessors demand high ba...
EMSOFT
2005
Springer
14 years 3 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
DAC
2001
ACM
14 years 10 months ago
2001
ACM
This work presents a new and computationally efficient performance optimization technique for distributed RLC interconnects based on a rigorous delay computation scheme. The new o...