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ISCA
2008
IEEE
14 years 2 months ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...
ISPASS
2008
IEEE
14 years 2 months ago
2008
IEEE
The evolution of microprocessors has been hindered by their increasing power consumption and the heat generation speed on-die. High temperature impairs the processor’s reliabili...
MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
CODES
2007
IEEE
14 years 2 months ago
2007
IEEE
Memory requirements of intellectual property components (IP) in contemporary multi-processor systems-on-chip are increasing. Large high-speed external memories, such as DDR2 SDRAM...
CODES
2007
IEEE
14 years 2 months ago
2007
IEEE
In battery-powered embedded systems, dedicated circuitry is used to convert stored energy into a form that can be directly used by processors. These power regulation devices seek ...