570 search results - page 107 / 114 » The behavior of resistive circuits |
MICRO
2010
IEEE
13 years 6 months ago
2010
IEEE
Bias temperature instability, hot-carrier injection, and gate-oxide wearout will cause severe lifetime degradation in the performance and the reliability of future CMOS devices. Th...
VTC
2010
IEEE
13 years 6 months ago
2010
IEEE
This paper reviews recent developments in vehicular radar at 60 GHz and above, with a focus on low cost integrated antennas. We investigate a number of radar and communication ante...
TVLSI
2010
13 years 3 months ago
2010
It has been recently demonstrated that digital signal processing systems may possibly leverage unconventional voltage overscaling (VOS) to reduce energy consumption while maintaini...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Three-dimensional (3-D) integrated circuits have emerged as promising candidates to overcome the interconnect bottlenecks of nanometer scale designs. While they offer several othe...
ICCAD
2002
IEEE
14 years 5 months ago
2002
IEEE
Abstract— With the increasing cost of global communication onchip, high-performance designs for data-intensive applications require architectures that distribute hardware resourc...