570 search results - page 87 / 114 » The behavior of resistive circuits |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
We define a robust fault model as a model where the existence of an undetectable fault implies the existence of logic redundancy, or more generally, a suboptimality in the synthe...
CIRA
2007
IEEE
14 years 2 months ago
2007
IEEE
— The ability to self-replicate is one of the distinctive features of living organisms. Robots capable of self-replication would have a profound impact on the field of robotics ...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...
IPPS
2007
IEEE
14 years 2 months ago
2007
IEEE
Partial differential equations (PDEs) are used to model physical phenomena and then appropriate convergent numerical algorithms are employed to solve them and create computer simu...
ISVLSI
2007
IEEE
14 years 2 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...