Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
—Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation co...
Abstract—Antenna problem is a phenomenon of plasma-induced gateoxide degradation. It directly affects manufacturability of very large scale integration (VLSI) circuits, especiall...
Li-Da Huang, Xiaoping Tang, Hua Xiang, D. F. Wong,...
We present a low-power sine-output Direct Digital Frequency Synthesizer (DDFS) realized in 0.18 µm CMOS that achieves 60 dBc spectral purity from DC to the Nyquist frequency. No ...
ForSyDe (FORmal SYstem DEsign) is a methodology which addresses the design of SoC applications which may contain control as well as data flow dominated parts. Starting with a for...