— Software simulation remains the most used method for VHDL RTL functional verification. The functional verification process essentially consists of two parts. The first one is t...
Youssef Serrestou, Vincent Beroulle, Chantal Robac...
We present a new method of built-in-self-test (BIST) for sequential circuits and system-on-a-chip (SOC) using characteristic faults and circuitspecific spectral information in th...
This paper proposes a low power VLIW processor generation method by automatically extracting non-redundant activation conditions of pipeline registers for clock gating. It is impo...
The advent of portable and high-density devices has made power consumption a critical design concern. In this paper, we address the problem of reducing power consumption via gate-...
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...