To ensure the power and signal integrity of modern VLSI circuits, it is crucial to analyze huge amount of nonlinear devices together with enormous interconnect and even substrate ...
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
This article proposes a completion-detection method for efficiently implementing Boolean functions as self-timed logic structures. Current-Sensing Completion Detection, CSCD, allow...
— Statistical static timing analysis deals with the increasing variations in manufacturing processes to reduce the pessimism in the worst case timing analysis. Because of the cor...
Bing Li, Ning Chen, Manuel Schmidt, Walter Schneid...
Optical lithography is a critical step in the semiconductor manufacturing process, and one key problem is the design of the photomask for a particular circuit pattern, given the o...