4306 search results - page 114 / 862 » Timed Testing with TorX |
VTS
2007
IEEE
14 years 4 months ago
2007
IEEE
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
One of the difficult problems which core-based systemon-chip (SoC) designs face is test access. For testing the cores in a SoC, a special mechanism is required, since they are no...
IEAAIE
2010
Springer
13 years 8 months ago
2010
Springer
In this paper, we propose a new diagnostic checking tool for fuzzy rule-based modelling of time series. Through the study of the residuals in the Lagrange Multiplier testing framew...
ASPDAC
2001
ACM
14 years 1 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
CSSC
2008
13 years 10 months ago
2008
Common software release procedures based on statistical techniques try to optimise the trade-off between further testing costs and costs due to remaining errors. We propose new so...