4306 search results - page 114 / 862 » Timed Testing with TorX |
118
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VTS
2007
IEEE
15 years 8 months ago
2007
IEEE
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
112
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DATE
2003
IEEE
15 years 7 months ago
2003
IEEE
One of the difficult problems which core-based systemon-chip (SoC) designs face is test access. For testing the cores in a SoC, a special mechanism is required, since they are no...
125
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IEAAIE
2010
Springer
15 years 11 days ago
2010
Springer
In this paper, we propose a new diagnostic checking tool for fuzzy rule-based modelling of time series. Through the study of the residuals in the Lagrange Multiplier testing framew...
114
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ASPDAC
2001
ACM
15 years 6 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
113
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CSSC
2008
15 years 2 months ago
2008
Common software release procedures based on statistical techniques try to optimise the trade-off between further testing costs and costs due to remaining errors. We propose new so...