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DATE
2002
IEEE
77views Hardware» more  DATE 2002»
14 years 3 months ago
An Optimal Algorithm for the Automatic Generation of March Tests
This paper presents an innovative algorithm for the automatic generation of March Tests. The proposed approach is able to generate an optimal March Test for an unconstrained set o...
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale...
VTS
2002
IEEE
126views Hardware» more  VTS 2002»
14 years 3 months ago
On Using Rectangle Packing for SOC Wrapper/TAM Co-Optimization
The testing time for a system-on-chip (SOC) is determined to a large extent by the design of test wrappers and the test access mechanism (TAM). Wrapper/TAM co-optimization is ther...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
DATE
2003
IEEE
128views Hardware» more  DATE 2003»
14 years 3 months ago
Virtual Compression through Test Vector Stitching for Scan Based Designs
We propose a technique for compressing test vectors. The technique reduces test application time and tester memory requirements by utilizing part of the predecessor response in co...
Wenjing Rao, Alex Orailoglu
PRL
2008
88views more  PRL 2008»
13 years 10 months ago
Time-efficient spam e-mail filtering using n-gram models
In this paper, we propose spam e-mail filtering methods having high accuracies and low time complexities. The methods are based on the n-gram approach and a heuristics which is re...
Ali Çiltik, Tunga Güngör
KBSE
2007
IEEE
14 years 4 months ago
Test suite reduction and prioritization with call trees
This paper presents a tool that (i) constructs tree-based models of a program’s behavior during testing and (ii) employs these trees while reordering and reducing a test suite. ...
Adam M. Smith, Joshua Geiger, Gregory M. Kapfhamme...