4306 search results - page 132 / 862 » Timed Testing with TorX |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper deals with Hybrid multisite testing of VLSI chips by utilizing automatic test equipment (ATE) in connection with built-in self-test (BIST). The performance of a multisi...
ECOOP
1997
Springer
14 years 2 months ago
1997
Springer
A type inclusion test is a procedure to decide whether two types are related by a given subtyping relationship. An efficient implementation of the type inclusion test plays an impo...
CAINE
2004
13 years 11 months ago
2004
- Automated tools for error prevention and error detection exist for many high-level languages, but have been nonexistent for assembly-language programs, embedded programs in parti...
VLSID
2009
IEEE
14 years 11 months ago
2009
IEEE
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
VTS
2008
IEEE
14 years 4 months ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...