4306 search results - page 134 / 862 » Timed Testing with TorX |
ATS
2003
IEEE
14 years 3 months ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
DFT
2005
IEEE
14 years 3 months ago
2005
IEEE
In this paper, we present two novel methodologies for testing the interconnect fabrics of network-on-chip (NoC) based chips. Both use the concept of recursive testing, with differ...
ISCAS
2005
IEEE
14 years 3 months ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
RTAS
2011
IEEE
13 years 2 months ago
2011
IEEE
— This paper presents the Fixed Priority until Zero Laxity (FPZL) scheduling algorithm for multiprocessor realtime systems. FPZL is similar to global fixed priority preemptive sc...
ICCAD
2000
IEEE
14 years 2 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...