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2008
Springer
13 years 7 months ago
IRPS - An Efficient Test Data Generation Strategy for Pairwise Testing
Software testing is an integral part of software engineering. Lack of testing often leads to disastrous consequences including loss of data, fortunes, and even lives. In order to e...
Mohammed I. Younis, Kamal Zuhairi Zamli, Nor Ashid...
VLSID
2004
IEEE
93views VLSI» more  VLSID 2004»
14 years 7 months ago
Random Access Scan: A solution to test power, test data volume and test time
Dong Hyun Baik, Kewal K. Saluja, Seiji Kajihara
VLSID
2005
IEEE
131views VLSI» more  VLSID 2005»
14 years 7 months ago
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
DATE
2005
IEEE
94views Hardware» more  DATE 2005»
13 years 9 months ago
A New Approach to Component Testing
Carefully tested electric/electronic components are a requirement for effective hardware-in-the-loop tests and vehicle tests in automotive industry. A new method for definition an...
Horst Brinkmeyer
ATAL
2008
Springer
13 years 9 months ago
eCAT: a tool for automating test cases generation and execution in testing multi-agent systems
We introduce eCAT, a tool that supports deriving test cases semi-automatically from goal-based analysis diagrams, generates meaningful test inputs based on agent interaction ontol...
Duy Cu Nguyen, Anna Perini, Paolo Tonella