4306 search results - page 140 / 862 » Timed Testing with TorX |
ICPR
2004
IEEE
14 years 11 months ago
2004
IEEE
We present a comparative study of face recognition performance with visible and thermal infrared imagery, emphasizing the influence of time-lapse between enrollment and testing im...
TCAD
1998
13 years 10 months ago
1998
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
ICCD
2003
IEEE
14 years 7 months ago
2003
IEEE
We discuss the compaction of independent test sequences for sequential circuits. Our first contribution is the formulation of this problem as an integer program, which we then so...
ATS
2003
IEEE
14 years 3 months ago
2003
IEEE
1 In this paper, we show that the scheduling of tests on the test access mechanism (TAM) is equivalent to independent job scheduling on identical machines and we make use of an exi...
ATS
2003
IEEE
14 years 3 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...