4306 search results - page 141 / 862 » Timed Testing with TorX |
ET
2002
13 years 10 months ago
2002
We propose an integrated framework for the design of SOC test solutions, which includes a set of algorithms for early design space exploration as well as extensive optimization for...
DATE
2009
IEEE
14 years 5 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
CSREASAM
2006
13 years 11 months ago
2006
The Session Initiation Protocol (SIP) is an application-layer protocol commonly used in VoIP for communication over the Internet. In this paper we describe a method to assess a pa...
ICCAD
2002
IEEE
14 years 7 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
NCA
2002
IEEE
13 years 10 months ago
2002
IEEE
One of the key problems in forming a smooth model from input-output data is the determination of which input variables are relevant in predicting a given output. In this paper we ...