4306 search results - page 142 / 862 » Timed Testing with TorX |
ICAC
2009
IEEE
14 years 5 months ago
2009
IEEE
We present an approach and implementation for run-time correlation of large volumes of log data and symptom matching of know issues in the context of large enterprise applications...
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
ICCD
2006
IEEE
14 years 7 months ago
2006
IEEE
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
ICMCS
2006
IEEE
14 years 4 months ago
2006
IEEE
In this work, we develop a hierarchical load testing architecture using large scale virtual clients to reduce the testing time and ensure the stability of the server for distribut...
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
Motivated by the increasing area and performance overhead caused by wrapping the embedded cores for modular SOC testing, this paper proposes a solution for reducing the number of ...