4306 search results - page 152 / 862 » Timed Testing with TorX |
VLSID
2004
IEEE
14 years 10 months ago
2004
IEEE
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
ICSE
2005
IEEE-ACM
14 years 10 months ago
2005
IEEE-ACM
Greedy algorithms for the construction of software interaction test suites are studied. A framework is developed to evaluate a large class of greedy methods that build suites one ...
DFT
2009
IEEE
14 years 5 months ago
2009
IEEE
Pre-fabrication design verification and post-fabrication chip testing are two important stages in the product realization process. These two stages consume a large part of resourc...
ASPDAC
2009
ACM
14 years 4 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
DFT
1998
IEEE
14 years 2 months ago
1998
IEEE
In the presence of multiple delay faults, automated diagnostic procedures that make a single fault assumption may give an incorrect diagnosis. In this paper, a systematic approach...